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X-ray emission from 424-MeV/u C ions impacting on selected target

  • Xian Ming Zhou
  • , Rui Cheng
  • , Yu Lei
  • , Yuan Bo Sun
  • , Yu Yu Wang
  • , Xing Wang
  • , Ge Xu
  • , Ce Xiang Mei
  • , Xiao An Zhang
  • , Xi Meng Chen
  • , Guo Qing Xiao
  • , Yong Tao Zhao
  • CAS - Institute of Modern Physics
  • Lanzhou University
  • Chinese Academy of Sciences
  • Xi'an Jiaotong University
  • Xianyang Normal University

科研成果: 期刊稿件 › 文章 › 同行评审

5 引用 (Scopus)

摘要

The K-shell x-rays of Ti, V, Fe, Co, Ni, Cu, and Zn induced by 424-MeV/u C6+ ion impact are measured. It is found that the K x-ray shifts to the high energy side and the intensity ratio of Kβ/Kα is larger than the atomic data, owing to the L-shell multiple-ionization. The x-ray production cross sections are deduced from the experimental counts and compared with the binary encounter approximation (BEA), plane wave approximation (PWBA) and energy-loss Coulomb-repulsion perturbed-stationary-state relativistic (ECPSSR) theoretical predictions. The BEA model with considering the multiple-ionization fluorescence yield is in better consistence with the experimental results. In addition, the cross section as a function of target atomic K-shell binding energy is presented.

源语言英语
期刊论文编号023402
期刊Chinese Physics B
卷25
期2
DOI
出版状态已出版 - 10 1月 2016

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