X-射线衍射仪中样品架对物相分析的影响

X-ray diffraction analyzer is one of the important methods for phase analysis because of its advantages of simple operation, non-destructive sample and comprehensive information. However, the sample holder with distinct materials can affect the diffraction of the sample in real operation. Therefore, the proper selection of sample holders is important to get the precise information on the fine structure of samples–crystallite size, crystallite type and chemical composition, etc. In this paper, the sample holders with various materials, i.e., aluminum, resin, non-reflecting material, slide glass and self-made groove, are applied to investigate the effect of materials on the diffraction of samples. The results show that different sample frames have their own clear back-view peaks due to their different properties. If the sample quantity is sufficient, it is recommended to use conventional aluminum or resin sample holders in order to obtain higher peak strength. If the sample quantity is small and most samples are of amorphous steamed bread peak, the influence of sample rack on X-ray diffraction peak should be considered. It is suggested to use non reflective sample plate or take 35° as the boundary. Aluminum sample holder is recommended before 35° and resin sample holder is recommended after 35° for characteristic peak. Slide and groove sample holders are mainly used for testing samples with special shape and specification.