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Wafer−Scale Growth of Fe−Doped Hexagonal Boron Nitride (hBN) Films via Co−Sputtering

  • Qiang Li
  • , Qifan Zhang
  • , Ransheng Chen
  • , Haoran Zhang
  • , Mingdi Wang
  • , Jingping Zhu
  • , Xiaoliang Wang
  • , Yuhuai Liu
  • , Feng Yun
  • Xi'an Jiaotong University
  • CAS - Institute of Semiconductors
  • Zhengzhou University
  • Nagoya University

科研成果: 期刊稿件文章同行评审

5 引用 (Scopus)

摘要

Fe−doped hBN film has great potential for use in spintronic applications. The wafer scale preparation of Fe−doped hBN films and their material properties are crucial for application in devices. In this work, Fe−doped films with 2−inch wafer scale were fabricated by magnetron co−sputtering, and the properties of the films were characterized. The crystal quality decreased, but the electrical performance was greatly improved. The average square resistance of Fe−doped film was 0.34 KΩ/sqr. Meanwhile, the Fe−doped films kept the characteristics of hBN well. The wavelength of absorption edge was 216 nm, and the corresponding optical band gap of 5.76 eV.

源语言英语
文章编号777
期刊Crystals
12
6
DOI
出版状态已出版 - 6月 2022

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