TY - JOUR
T1 - Unveiling Dielectric Interface Charge Dynamics Under Unipolar Repetitive Pulses with the In-Situ Pockels Effect Technique
AU - Li, Kaixuan
AU - Zhang, Boya
AU - Yang, Ziyue
AU - Yao, Minghan
AU - Li, Yixuan
AU - Li, Jie
AU - Zintak, Zachary
AU - Yuchi, Qingrui
AU - Li, Xingwen
N1 - Publisher Copyright:
© 2025 American Chemical Society.
PY - 2025/4/30
Y1 - 2025/4/30
N2 - Unipolar repetitive pulse (URP) is one of the factors that jeopardize power electronic devices. Failures induced by URP often occur at the interface between two different dielectrics, and this location’s inaccessibility makes detection challenging. In this paper, the Pockels effect is utilized for noninvasive monitoring, for the first time allowing the dynamic evolution of interface charges to be observed during the URP interface discharge process, thereby achieving visualization of power modules packaging interface charges that were previously undetectable. The URP interface discharge is updated to include two stages: propagation and persistence. The former is marked by the simultaneous conclusion of interface charge propagation and pulse current, while the latter indicates the persistent activity of interface charges. Furthermore, the evolution of interface charges over multiple URP cycles is defined into different stages based on distribution characteristics. Ultimately, the interface charge density is used to assess interface insulation damage.
AB - Unipolar repetitive pulse (URP) is one of the factors that jeopardize power electronic devices. Failures induced by URP often occur at the interface between two different dielectrics, and this location’s inaccessibility makes detection challenging. In this paper, the Pockels effect is utilized for noninvasive monitoring, for the first time allowing the dynamic evolution of interface charges to be observed during the URP interface discharge process, thereby achieving visualization of power modules packaging interface charges that were previously undetectable. The URP interface discharge is updated to include two stages: propagation and persistence. The former is marked by the simultaneous conclusion of interface charge propagation and pulse current, while the latter indicates the persistent activity of interface charges. Furthermore, the evolution of interface charges over multiple URP cycles is defined into different stages based on distribution characteristics. Ultimately, the interface charge density is used to assess interface insulation damage.
KW - Pockels effect
KW - dielectric interface
KW - discharge spatiotemporal evolutions
KW - interfacial charge dynamics
KW - unipolar repetitive pulse
UR - https://www.scopus.com/pages/publications/105003802920
U2 - 10.1021/acsami.4c20354
DO - 10.1021/acsami.4c20354
M3 - 文章
C2 - 40091643
AN - SCOPUS:105003802920
SN - 1944-8244
VL - 17
SP - 25894
EP - 25902
JO - ACS Applied Materials and Interfaces
JF - ACS Applied Materials and Interfaces
IS - 17
ER -