跳到主要导航 跳到搜索 跳到主要内容

Unsupervised anomaly detection for critical components in industrial manufacturing via multi-stage clustering

  • Jichen Zhang
  • , Jianchen Zhang
  • , Xianglong Zhou
  • , Xue Li
  • , Songhao Zhang
  • , Yuqian Sun
  • , Qiang Duan
  • , Jun Xu
  • , Rui Li
  • Shandong Inspur Science Research Institute
  • Xi'an Jiaotong University

科研成果: 书/报告/会议事项章节会议稿件同行评审

摘要

To address the challenges of confidentiality in industrial field data and the scarcity of labeled samples, this study proposes an unsupervised fault diagnosis framework that achieves autonomous discovery of fault modes through multi-stage feature optimization and robust clustering analysis. The method consists of four core components: simulation dataset construction, feature extraction and selection, outlier anomaly detection, and clustering-based common anomaly detection. The generalization ability of the proposed method has been validated through CWRU cross-load testing, which accurately identifies 10 fault states with an accuracy of 95.2%. The collaborative design of feature engineering and anomaly cleaning effectively enhances clustering stability and the ability to distinguish complex faults. The research provides an interpretable and low-cost solution for intelligent diagnosis in privacy-sensitive industrial environments, offering an innovative technological pathway for health management in intelligent manufacturing systems.

源语言英语
主期刊名Second International Conference on Image Processing, Intelligent Control, and Computer Engineering, IPICE 2025
编辑Fuqiang Liu, Nguyen Huu Trung
出版商SPIE
ISBN(电子版)9781510698253
DOI
出版状态已出版 - 4 11月 2025
活动2nd International Conference on Image Processing, Intelligent Control, and Computer Engineering, IPICE 2025 - Zhengzhou, 中国
期限: 25 7月 202527 7月 2025

出版系列

姓名Proceedings of SPIE - The International Society for Optical Engineering
13942
ISSN(印刷版)0277-786X
ISSN(电子版)1996-756X

会议

会议2nd International Conference on Image Processing, Intelligent Control, and Computer Engineering, IPICE 2025
国家/地区中国
Zhengzhou
时期25/07/2527/07/25

学术指纹

探究 'Unsupervised anomaly detection for critical components in industrial manufacturing via multi-stage clustering' 的科研主题。它们共同构成独一无二的指纹。

引用此