Ultrahigh-Resolution Transmission Electron Microscopy at Negative Spherical Aberration

Knut W. Urban; Juri Barthel; Lothar Houben; Chun Lin Jia; Markus Lentzen; Andreas Thust; Karsten Tillmann

doi:10.1002/9783527641864.ch3

Ultrahigh-Resolution Transmission Electron Microscopy at Negative Spherical Aberration

Knut W. Urban
, Juri Barthel
, Lothar Houben
, Chun Lin Jia
, Markus Lentzen
, Andreas Thust
, Karsten Tillmann

电子与信息学部

Jülich Research Centre

科研成果: 书/报告/会议事项章节 › 章节 › 同行评审

2 引用（Scopus）

源语言	英语
主期刊名	Handbook of Nanoscopy
出版商	Wiley-VCH
页	81-107
页数	27
卷	1
ISBN（印刷版）	9783527317066
DOI	https://doi.org/10.1002/9783527641864.ch3
出版状态	已出版 - 23 5月 2012

访问文件

10.1002/9783527641864.ch3

其它文件与链接

链接到 Scopus 的出版物

引用此

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title = "Ultrahigh-Resolution Transmission Electron Microscopy at Negative Spherical Aberration",

keywords = "Contrast, NCSI imaging, Picometre microscopy, ferroelectric domain walls, Spherical aberration, Ultrahigh-resolution TEM",

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T1 - Ultrahigh-Resolution Transmission Electron Microscopy at Negative Spherical Aberration

AU - Urban, Knut W.

AU - Barthel, Juri

AU - Houben, Lothar

AU - Jia, Chun Lin

AU - Lentzen, Markus

AU - Thust, Andreas

AU - Tillmann, Karsten

PY - 2012/5/23

Y1 - 2012/5/23

KW - Contrast

KW - NCSI imaging

KW - Picometre microscopy, ferroelectric domain walls

KW - Spherical aberration

KW - Ultrahigh-resolution TEM

UR - https://www.scopus.com/pages/publications/84888049179

U2 - 10.1002/9783527641864.ch3

DO - 10.1002/9783527641864.ch3

M3 - 章节

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SN - 9783527317066

VL - 1

SP - 81

EP - 107

BT - Handbook of Nanoscopy

PB - Wiley-VCH

ER -