Trap-assisted charge injection into large bandgap polymer semiconductors

Dongdong Wang; Michael Fina; Suhan Kim; Chunmei Zhang; Ting Zhang; Yonghong Deng; Kai Chen; Lijuan Liang; Samuel S. Mao; Andrew M. Minor; Gao Liu

doi:10.3390/ma12152427

Trap-assisted charge injection into large bandgap polymer semiconductors

Dongdong Wang
, Michael Fina
, Suhan Kim
, Chunmei Zhang
, Ting Zhang
, Yonghong Deng
, Kai Chen
, Lijuan Liang
, Samuel S. Mao
, Andrew M. Minor
, Gao Liu

材料科学与工程学院

Beijing Institute of Graphic Communication
LBL
University of California at Berkeley
Beijing Institute of Technology
South China University of Technology

科研成果: 期刊稿件 › 文章 › 同行评审

3 引用（Scopus）

摘要

The trap-assisted charge injection in polyfluorene-poly(3,4-ethylenedioxythiophene): poly(styrenesulfonate) (PEDOT:PSS) model systems with an Al or Al/LiF cathode is investigated. We find that inserting 1.3 nm LiF increases electron and hole injections simultaneously and the increase of holes is greater than electrons. The evolution of internal interfaces within polymer light-emitting diodes is observed by transmission electron microscopy, which reveals that the introduction of LiF improves the interface stability at both the cathode (cathode/polymer) and the anode (indium tin oxide (ITO)/PEDOT:PSS). Above-mentioned experimental results have been compared to the numerical simulations with a revised Davids model and potential physical mechanisms for the trap-assisted charge injection are discussed.

源语言	英语
文章编号	2427
期刊	Materials
卷	12
期	15
DOI	https://doi.org/10.3390/ma12152427
出版状态	已出版 - 1 8月 2019

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10.3390/ma12152427

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title = "Trap-assisted charge injection into large bandgap polymer semiconductors",

abstract = "The trap-assisted charge injection in polyfluorene-poly(3,4-ethylenedioxythiophene): poly(styrenesulfonate) (PEDOT:PSS) model systems with an Al or Al/LiF cathode is investigated. We find that inserting 1.3 nm LiF increases electron and hole injections simultaneously and the increase of holes is greater than electrons. The evolution of internal interfaces within polymer light-emitting diodes is observed by transmission electron microscopy, which reveals that the introduction of LiF improves the interface stability at both the cathode (cathode/polymer) and the anode (indium tin oxide (ITO)/PEDOT:PSS). Above-mentioned experimental results have been compared to the numerical simulations with a revised Davids model and potential physical mechanisms for the trap-assisted charge injection are discussed.",

keywords = "Charge injection, Interface stability, Polymer light-emitting diodes, Trap",

author = "Dongdong Wang and Michael Fina and Suhan Kim and Chunmei Zhang and Ting Zhang and Yonghong Deng and Kai Chen and Lijuan Liang and Mao, \{Samuel S.\} and Minor, \{Andrew M.\} and Gao Liu",

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doi = "10.3390/ma12152427",

language = "英语",

volume = "12",

journal = "Materials",

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TY - JOUR

T1 - Trap-assisted charge injection into large bandgap polymer semiconductors

AU - Wang, Dongdong

AU - Fina, Michael

AU - Kim, Suhan

AU - Zhang, Chunmei

AU - Zhang, Ting

AU - Deng, Yonghong

AU - Chen, Kai

AU - Liang, Lijuan

AU - Mao, Samuel S.

AU - Minor, Andrew M.

AU - Liu, Gao

PY - 2019/8/1

Y1 - 2019/8/1

N2 - The trap-assisted charge injection in polyfluorene-poly(3,4-ethylenedioxythiophene): poly(styrenesulfonate) (PEDOT:PSS) model systems with an Al or Al/LiF cathode is investigated. We find that inserting 1.3 nm LiF increases electron and hole injections simultaneously and the increase of holes is greater than electrons. The evolution of internal interfaces within polymer light-emitting diodes is observed by transmission electron microscopy, which reveals that the introduction of LiF improves the interface stability at both the cathode (cathode/polymer) and the anode (indium tin oxide (ITO)/PEDOT:PSS). Above-mentioned experimental results have been compared to the numerical simulations with a revised Davids model and potential physical mechanisms for the trap-assisted charge injection are discussed.

AB - The trap-assisted charge injection in polyfluorene-poly(3,4-ethylenedioxythiophene): poly(styrenesulfonate) (PEDOT:PSS) model systems with an Al or Al/LiF cathode is investigated. We find that inserting 1.3 nm LiF increases electron and hole injections simultaneously and the increase of holes is greater than electrons. The evolution of internal interfaces within polymer light-emitting diodes is observed by transmission electron microscopy, which reveals that the introduction of LiF improves the interface stability at both the cathode (cathode/polymer) and the anode (indium tin oxide (ITO)/PEDOT:PSS). Above-mentioned experimental results have been compared to the numerical simulations with a revised Davids model and potential physical mechanisms for the trap-assisted charge injection are discussed.

KW - Charge injection

KW - Interface stability

KW - Polymer light-emitting diodes

KW - Trap

UR - https://www.scopus.com/pages/publications/85070377688

U2 - 10.3390/ma12152427

DO - 10.3390/ma12152427

M3 - 文章

AN - SCOPUS:85070377688

SN - 1996-1944

VL - 12

JO - Materials

JF - Materials

IS - 15

M1 - 2427

ER -

Trap-assisted charge injection into large bandgap polymer semiconductors

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