摘要
We model the transient free electron density in laser-irradiated dielectrics with a kinetic approach. The internal electrical field responsible for the strength and mechanisms of photon absorption is calculated self-consistently in dependence on the increasing free electron density. The results show the threshold behavior of the absorbed energy, responsible for dielectric breakdown.
| 源语言 | 英语 |
|---|---|
| 页(从-至) | 16-20 |
| 页数 | 5 |
| 期刊 | Contributions to Plasma Physics |
| 卷 | 50 |
| 期 | 1 |
| DOI | |
| 出版状态 | 已出版 - 1月 2010 |
| 已对外发布 | 是 |
学术指纹
探究 'Tracing laser-induced dielectric breakdown in solids' 的科研主题。它们共同构成独一无二的指纹。引用此
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