摘要
In this paper, the influence of contact materials on late discharges in vacuum switching devices was investigated. Experimental results show that the HV withstand capability of contact materials has a strong influence on the frequency of late discharges in vacuum switching devices. The addition of a small amount of W and Co into the CuCr alloy increases the voltage withstand significantly, resulting in a reduction of the frequency of late discharges by as much as 50%. Therefore, an efficient approach to decrease the frequency of late discharges is to increase trie HV withstand of the contact materials.
| 源语言 | 英语 |
|---|---|
| 页(从-至) | 913-915 |
| 页数 | 3 |
| 期刊 | IEEE Transactions on Dielectrics and Electrical Insulation |
| 卷 | 6 |
| 期 | 6 |
| DOI | |
| 出版状态 | 已出版 - 12月 1999 |
学术指纹
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