TY - GEN
T1 - Test technology of UHV AC bushing and its application
AU - Wu, Chao
AU - Li, Jinzhong
AU - Tang, Hao
AU - Guan, Jianxin
AU - Jia, Pengfei
AU - Deng, Junyu
N1 - Publisher Copyright:
© 2016 IEEE.
PY - 2016/12/27
Y1 - 2016/12/27
N2 - For the urgent needs of the bushing test technology and inspection method with the rapid development of UHV transmission project, based on the technical requirements of the UHV transformer bushing and use for reference on the existing transformer bushing test technology, a complete set of UHV transformer bushing test system including insulation test, thermal rise test has been established, and also the relevant test methods has been proposed. The test technology proposed in this paper has been applied to the UHV transformer bushing used in the UHV power transmission engineering, meanwhile the validity of the test system and technology has been verified.
AB - For the urgent needs of the bushing test technology and inspection method with the rapid development of UHV transmission project, based on the technical requirements of the UHV transformer bushing and use for reference on the existing transformer bushing test technology, a complete set of UHV transformer bushing test system including insulation test, thermal rise test has been established, and also the relevant test methods has been proposed. The test technology proposed in this paper has been applied to the UHV transformer bushing used in the UHV power transmission engineering, meanwhile the validity of the test system and technology has been verified.
KW - Temperature rise test
KW - Test of insulation characteristics
KW - UHV transformer
KW - bushing
UR - https://www.scopus.com/pages/publications/85010460636
U2 - 10.1109/ICHVE.2016.7800890
DO - 10.1109/ICHVE.2016.7800890
M3 - 会议稿件
AN - SCOPUS:85010460636
T3 - ICHVE 2016 - 2016 IEEE International Conference on High Voltage Engineering and Application
BT - ICHVE 2016 - 2016 IEEE International Conference on High Voltage Engineering and Application
PB - Institute of Electrical and Electronics Engineers Inc.
T2 - 5th IEEE International Conference on High Voltage Engineering and Application, ICHVE 2016
Y2 - 19 September 2016 through 22 September 2016
ER -