TY - GEN
T1 - Surface trap and carrier transport of aged and pristine oil-paper under harmonic voltage by surface potential decay
AU - Li, Shijun
AU - Yan, Wei
AU - Yan, Chenyu
AU - Min, Daomin
AU - Li, Shengtao
AU - Kang, Wenbin
N1 - Publisher Copyright:
© 2017 IEEE.
PY - 2017/7/1
Y1 - 2017/7/1
N2 - Harmonic voltage can accelerate the aging of insulating materials. In this paper, an ac voltage with low-order harmonic components was applied on oil-paper insulated bushing with a duration of one month. Oil-paper samples extracted from bushing were tested by Surface Potential Decay (SPD) after positive and negative corona charging. Experimental results of SPD illustrate that the surface potential of aged oil-paper sample drops faster than the pristine one. Surface trap distribution is obtained for both pristine and aged samples. Besides, the hole and electron motilities are calculated based on transit time and initial surface potential. The conclusion can be reached that during the harmonics aging experiment, the scission of cellulose occurred under the thermal, electrical and mechanical stress, inducing surface traps and leading to higher nobilities of electron and hole.
AB - Harmonic voltage can accelerate the aging of insulating materials. In this paper, an ac voltage with low-order harmonic components was applied on oil-paper insulated bushing with a duration of one month. Oil-paper samples extracted from bushing were tested by Surface Potential Decay (SPD) after positive and negative corona charging. Experimental results of SPD illustrate that the surface potential of aged oil-paper sample drops faster than the pristine one. Surface trap distribution is obtained for both pristine and aged samples. Besides, the hole and electron motilities are calculated based on transit time and initial surface potential. The conclusion can be reached that during the harmonics aging experiment, the scission of cellulose occurred under the thermal, electrical and mechanical stress, inducing surface traps and leading to higher nobilities of electron and hole.
UR - https://www.scopus.com/pages/publications/85045223764
U2 - 10.1109/CEIDP.2017.8257540
DO - 10.1109/CEIDP.2017.8257540
M3 - 会议稿件
AN - SCOPUS:85045223764
T3 - Annual Report - Conference on Electrical Insulation and Dielectric Phenomena, CEIDP
SP - 94
EP - 97
BT - CEIDP 2017 - IEEE Conference on Electrical Insulation and Dielectric Phenomenon
PB - Institute of Electrical and Electronics Engineers Inc.
T2 - 2017 IEEE Conference on Electrical Insulation and Dielectric Phenomenon, CEIDP 2017
Y2 - 22 October 2017 through 25 October 2017
ER -