摘要
A testing apparatus for voltage endurance of film materials subjected to partial discharges on its surface was developed according to IEC-343 and ASTM-2275. It consists of electrode unit, power supply unit and control unit, and has the function of testing simultaneously six group samples. The single chip computer is used to time and to switch off the circuit in which the sample is breakdown. The EEPROM is used to record the results. The corona-resistance of polyimide film before and after compound with nano-inorganic oxide is tested and the influence of the component and content on corona-resistance of material is researched. The Cp-ω and tg δ-ω of samples both before and after corona aging are first studied by HP 4294A and the surface morphology characterized by AFM.
| 源语言 | 英语 |
|---|---|
| 页 | 1138-1141 |
| 页数 | 4 |
| 出版状态 | 已出版 - 2003 |
| 已对外发布 | 是 |
| 活动 | Proceedings of the 7th International Conference on Properties and Applications of Dielectric Materials - Nagoya, 日本 期限: 1 6月 2003 → 5 6月 2003 |
会议
| 会议 | Proceedings of the 7th International Conference on Properties and Applications of Dielectric Materials |
|---|---|
| 国家/地区 | 日本 |
| 市 | Nagoya |
| 时期 | 1/06/03 → 5/06/03 |
学术指纹
探究 'Study on corona-resistance of polyimide-nano inorganic composites' 的科研主题。它们共同构成独一无二的学术指纹。引用此
- APA
- Author
- BIBTEX
- Harvard
- Standard
- RIS
- Vancouver