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Statistical image reconstruction for low-dose dual energy CT using alpha-divergence constrained spectral redundancy information

  • Dong Zeng
  • , Zhaoying Bian
  • , Jing Huang
  • , Yuting Liao
  • , Jing Wang
  • , Zhengrong Liang
  • , Jianhua Ma
  • Southern Medical University
  • University of Texas Southwestern Medical Center
  • Stony Brook University

科研成果: 书/报告/会议事项章节 › 会议稿件 › 同行评审

摘要

Dual energy computed tomography (DECT) has flu-proved capability of differentiating different materials compared to conventional CT. However, due to non-negligible radiation exposure to patients, dose reduction has recently become a critical concern in CT imaging field. Moreover, direct material decomposition techniques such as numerical inversion can yield significantly amplified noise in the basic material images, and this is another common tissue in DECT imaging. In this work, to address the two issues, we present an iterative algorithm. More specifically, the DECT images are reconstructed by minimizing one objective function consisting a data-fidelity term using Alpha-divergence to describe the statistical distribution of the DE sinogram data and a regularization term utilizing redundant information within DECT images. For simplicity, the present algorithm is termed as "AlphaD-aviNLM". To minimize the associative objective function, a modified proximal forward-backward splitting algorithm is proposed. Digital phantom was utilized to validate and evaluate the present AlphaD-aviNLM algorithm. The experimental results characterize the performance of the present AlphaD-aviNLM algorithm.

源语言英语
主期刊名2016 IEEE Nuclear Science Symposium, Medical Imaging Conference and Room-Temperature Semiconductor Detector Workshop, NSS/MIC/RTSD 2016
出版商Institute of Electrical and Electronics Engineers Inc.
ISBN(电子版)9781509016426
DOI
出版状态已出版 - 16 10月 2017
已对外发布是
活动2016 IEEE Nuclear Science Symposium, Medical Imaging Conference and Room-Temperature Semiconductor Detector Workshop, NSS/MIC/RTSD 2016 - Strasbourg, 法国
期限: 29 10月 2016 → 6 11月 2016

丛书

姓名2016 IEEE Nuclear Science Symposium, Medical Imaging Conference and Room-Temperature Semiconductor Detector Workshop, NSS/MIC/RTSD 2016
卷2017-January

会议

会议2016 IEEE Nuclear Science Symposium, Medical Imaging Conference and Room-Temperature Semiconductor Detector Workshop, NSS/MIC/RTSD 2016
国家/地区法国
市Strasbourg
时期29/10/16 → 6/11/16

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