Statistical analysis of defects and maintenance advice for GIS in different operating years above 110 kV

Xin Zhang; Gaoyang Li; Ronghui Huang; Zhen Xiang; Yuming Zhang; Senjing Yao; Xiaohua Wang

doi:10.13296/j.1001-1609.hva.2016.03.030

Statistical analysis of defects and maintenance advice for GIS in different operating years above 110 kV

Xin Zhang
, Gaoyang Li
, Ronghui Huang
, Zhen Xiang
, Yuming Zhang
, Senjing Yao
, Xiaohua Wang

电气工程学院

Shenzhen Power Supply Corporation
Xi'an Jiaotong University

科研成果: 期刊稿件 › 文章 › 同行评审

40 引用（Scopus）

摘要

The defect rate of gas insulted switchgear (GIS) usually increases along with its operating years. According to statistical analysis of defect rate of GIS in different life period, and the similar analysis for its components respectively, including the control system, seal ring and mechanism, the growth rule of different kind of defects is revealed. Moreover, some maintenance advice for GIS of different lifetime is also proposed.

源语言	英语
页（从-至）	184-188 and 194
期刊	Gaoya Dianqi/High Voltage Apparatus
卷	52
期	3
DOI	https://doi.org/10.13296/j.1001-1609.hva.2016.03.030
出版状态	已出版 - 16 3月 2016

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10.13296/j.1001-1609.hva.2016.03.030

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abstract = "The defect rate of gas insulted switchgear (GIS) usually increases along with its operating years. According to statistical analysis of defect rate of GIS in different life period, and the similar analysis for its components respectively, including the control system, seal ring and mechanism, the growth rule of different kind of defects is revealed. Moreover, some maintenance advice for GIS of different lifetime is also proposed.",

keywords = "Control system, Defect rate, Gas insulted switchgear (GIS), Mechanism, Operating year, Seal",

author = "Xin Zhang and Gaoyang Li and Ronghui Huang and Zhen Xiang and Yuming Zhang and Senjing Yao and Xiaohua Wang",

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T1 - Statistical analysis of defects and maintenance advice for GIS in different operating years above 110 kV

AU - Zhang, Xin

AU - Li, Gaoyang

AU - Huang, Ronghui

AU - Xiang, Zhen

AU - Zhang, Yuming

AU - Yao, Senjing

AU - Wang, Xiaohua

PY - 2016/3/16

Y1 - 2016/3/16

N2 - The defect rate of gas insulted switchgear (GIS) usually increases along with its operating years. According to statistical analysis of defect rate of GIS in different life period, and the similar analysis for its components respectively, including the control system, seal ring and mechanism, the growth rule of different kind of defects is revealed. Moreover, some maintenance advice for GIS of different lifetime is also proposed.

AB - The defect rate of gas insulted switchgear (GIS) usually increases along with its operating years. According to statistical analysis of defect rate of GIS in different life period, and the similar analysis for its components respectively, including the control system, seal ring and mechanism, the growth rule of different kind of defects is revealed. Moreover, some maintenance advice for GIS of different lifetime is also proposed.

KW - Control system

KW - Defect rate

KW - Gas insulted switchgear (GIS)

KW - Mechanism

KW - Operating year

KW - Seal

UR - https://www.scopus.com/pages/publications/84973363502

U2 - 10.13296/j.1001-1609.hva.2016.03.030

DO - 10.13296/j.1001-1609.hva.2016.03.030

M3 - 文章

AN - SCOPUS:84973363502

SN - 1001-1609

VL - 52

SP - 184-188 and 194

JO - Gaoya Dianqi/High Voltage Apparatus

JF - Gaoya Dianqi/High Voltage Apparatus

IS - 3

ER -

Statistical analysis of defects and maintenance advice for GIS in different operating years above 110 kV

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