@inproceedings{708beab818d949f6a17928c9ec3d8ece,
title = "Space charge in nanodielectrics and its impact on electrical performance",
abstract = "Nanodielectrics have been actively investigated in last two decades as they have shown some improved dielectric properties that are important for high voltage insulation applications. One of these improvements is the reduction in space charge when the nanodielectrics are subjected to dc electric fields. The formation of deep trap after introducing nanoparticles in the material has been widely reported. However, the mechanisms that are responsible for the charge suppression are not detailed. More importantly, the effect of charge suppression is strongly dependent on the amount of nanoparticles, i.e. loading concentration. In the present paper, a schematic model has been proposed based on deep trap concept. A tunneling process has been introduced when the trapping sites become closer which is the case for high nanofillers concentration. Based on the new model, charge formation and dynamics in nanodielectrics with different loading concentrations can be estimated and electrical performance anticipated. A range of factors that can influence charge trapping/detrapping have been discussed.",
keywords = "deep traps, electrical perfromance, nanodielectrics, space charge, tunnelling",
author = "George Chen and Shengtao Li and Lisheng Zhong",
note = "Publisher Copyright: {\textcopyright} 2015 IEEE.; 11th IEEE International Conference on the Properties and Applications of Dielectric Materials, ICPADM 2015 ; Conference date: 19-07-2015 Through 22-07-2015",
year = "2015",
month = oct,
day = "8",
doi = "10.1109/ICPADM.2015.7295202",
language = "英语",
series = "Proceedings of the IEEE International Conference on Properties and Applications of Dielectric Materials",
publisher = "Institute of Electrical and Electronics Engineers Inc.",
pages = "36--39",
booktitle = "ICPADM 2015 - 2015 IEEE 11th International Conference on the Properties and Applications of Dielectric Materials",
}