TY - GEN
T1 - Some Ideas about Engineering Dielectrics Researches
AU - Li, Shengtao
AU - Lei, Qingquan
N1 - Publisher Copyright:
© 2019 IEEE.
PY - 2019/4
Y1 - 2019/4
N2 - Nanometric dielectrics have always been a focus of engineering dielectrics. Researchers have deepened the understanding of nanometric dielectrics through multi-angle studies. In this paper, we put forward some ideas about engineering dielectrics researches. It is proposed that the name nanodielectric composites should be more precise according to low dimensional physics. For space charge limited current (SCLC), it is considered that SCLC is not solely determined by carriers which are the same as injected carriers in the transition from ohmic region to high field region. In view of pulse related space charge measurement methods, especially pulsed electroacoustic (PEA) method has been mainly adopted, its advantages and disadvantages are described. At last, experimental results of trap-related breakdown and flashover phenomenon, functionalized groups related interfacial compatibility, and classified effects of nanofillers on short-term breakdown and long-term failure are presented to inspire further discussion.
AB - Nanometric dielectrics have always been a focus of engineering dielectrics. Researchers have deepened the understanding of nanometric dielectrics through multi-angle studies. In this paper, we put forward some ideas about engineering dielectrics researches. It is proposed that the name nanodielectric composites should be more precise according to low dimensional physics. For space charge limited current (SCLC), it is considered that SCLC is not solely determined by carriers which are the same as injected carriers in the transition from ohmic region to high field region. In view of pulse related space charge measurement methods, especially pulsed electroacoustic (PEA) method has been mainly adopted, its advantages and disadvantages are described. At last, experimental results of trap-related breakdown and flashover phenomenon, functionalized groups related interfacial compatibility, and classified effects of nanofillers on short-term breakdown and long-term failure are presented to inspire further discussion.
KW - PEA
KW - conductivity
KW - deep traps
KW - engineering dielectrics
KW - interfacial compatibility
KW - scattering effect
UR - https://www.scopus.com/pages/publications/85067844698
U2 - 10.1109/ICEMPE.2019.8727286
DO - 10.1109/ICEMPE.2019.8727286
M3 - 会议稿件
AN - SCOPUS:85067844698
T3 - ICEMPE 2019 - 2nd International Conference on Electrical Materials and Power Equipment, Proceedings
SP - 9
EP - 11
BT - ICEMPE 2019 - 2nd International Conference on Electrical Materials and Power Equipment, Proceedings
PB - Institute of Electrical and Electronics Engineers Inc.
T2 - 2nd International Conference on Electrical Materials and Power Equipment, ICEMPE 2019
Y2 - 7 April 2019 through 10 April 2019
ER -