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Solution Monolayer Epitaxy for Tunable Atomically Sharp Oxide Interfaces

  • Alon Ron
  • , Amir Hevroni
  • , Eran Maniv
  • , Michael Mograbi
  • , Lei Jin
  • , Chun Lin Jia
  • , Knut W. Urban
  • , Gil Markovich
  • , Yoram Dagan
  • Tel Aviv University
  • Jülich Research Centre

科研成果: 期刊稿件文章同行评审

5 引用 (Scopus)

摘要

Interfaces play an important role in a variety of devices including transistors, solar cells, and memory components. Atomically sharp interfaces are essential to avoid charge traps that hamper efficient device operation. Sharp interfaces usually require thin-film fabrication techniques involving ultrahigh vacuum and high substrate temperatures. A new self-limiting wet chemical process for deposition of epitaxial layers from alkoxide precursors is presented. This method is fast, cheap, and yields perfect interfaces as validated by various analysis techniques. It allows the growth of heterostructures with half-unit-cell resolution. The method is demonstrated by designing a hole-type oxide interface SrTiO3/BaO/LaAlO3. It is shown that transport through this interface exhibits properties of mixed electron–hole contributions with hole mobility exceeding that of electrons.

源语言英语
文章编号1700688
期刊Advanced Materials Interfaces
4
22
DOI
出版状态已出版 - 23 11月 2017
已对外发布

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