Simple and convenient nonoptical shear force sensor for shear force and near-field optical microscopes

Y. Bai; J. D. White; G. Zhang; G. Chen; X. Hou

doi:10.1063/1.125131

Simple and convenient nonoptical shear force sensor for shear force and near-field optical microscopes

Y. Bai
, J. D. White
, G. Zhang
, G. Chen
, X. Hou

CAS - Xi'an Institute of Optics and Precision Mechanics
Multimedia University

科研成果: 期刊稿件 › 文章 › 同行评审

4 引用（Scopus）

摘要

A simple, compact, and inexpensive method for shear force distance regulation is presented. A single piezoelectric cantilever is employed to both dither a fiber probe and to detect the decrease in piezotension-induced voltage as it approaches the sample surface. On resonance, the large piezotension-induced voltage (∼0.2 mV/nm) allows for simple electronics to be used. It is expected to find application both in shear force microscopy and for shear force distance regulation in near-field optical microscopy.

源语言	英语
页（从-至）	2731-2733
页数	3
期刊	Applied Physics Letters
卷	75
期	18
DOI	https://doi.org/10.1063/1.125131
出版状态	已出版 - 1 11月 1999
已对外发布	是

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abstract = "A simple, compact, and inexpensive method for shear force distance regulation is presented. A single piezoelectric cantilever is employed to both dither a fiber probe and to detect the decrease in piezotension-induced voltage as it approaches the sample surface. On resonance, the large piezotension-induced voltage (∼0.2 mV/nm) allows for simple electronics to be used. It is expected to find application both in shear force microscopy and for shear force distance regulation in near-field optical microscopy.",

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AU - Hou, X.

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AB - A simple, compact, and inexpensive method for shear force distance regulation is presented. A single piezoelectric cantilever is employed to both dither a fiber probe and to detect the decrease in piezotension-induced voltage as it approaches the sample surface. On resonance, the large piezotension-induced voltage (∼0.2 mV/nm) allows for simple electronics to be used. It is expected to find application both in shear force microscopy and for shear force distance regulation in near-field optical microscopy.

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Simple and convenient nonoptical shear force sensor for shear force and near-field optical microscopes

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