摘要
GaN offers an excellent potential for fabricating X-ray detectors, taking advantage of its superior material properties and well-developed manufacturing technologies. In this letter, we demonstrated a self-powered fast-response X-ray detection using GaN-based vertical p-n diodes grown on a bulk GaN substrate. Attributed to the high crystalline quality achieved by homoepitaxy, the fabricated photodiodes exhibited an excellent rectification behavior, and therefore, a strong photovoltaic response to X-ray illumination when biased at 0 V. The transient X-ray detection analysis revealed that the self-powered detectors have a relatively short response time (<20 ms) and a good linear response to the X-ray incident dose rate with a high specific sensitivity of 170 nC·Gy-1·cm-2.
| 源语言 | 英语 |
|---|---|
| 期刊论文编号 | 8705386 |
| 页(从-至) | 1044-1047 |
| 页数 | 4 |
| 期刊 | IEEE Electron Device Letters |
| 卷 | 40 |
| 期 | 7 |
| DOI | |
| 出版状态 | 已出版 - 7月 2019 |
| 已对外发布 | 是 |
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