TY - GEN
T1 - Self-healing Properties of Metalized Polypropylene Film with Elevated Sheet Resistance
AU - Jia, Lei
AU - Cheng, Lu
AU - Liu, Wenfeng
AU - Xu, Zhe
AU - Zhang, Yuxin
AU - Li, Shengtao
N1 - Publisher Copyright:
© 2020 IEEE.
PY - 2020/9/6
Y1 - 2020/9/6
N2 - Metalized polypropylene films are widely used as dielectric materials in self-healing (SH) power capacitors due to its higher operation electric field, and the SH properties of metalized film directly decided the performance of capacitors. Among all the film parameters, the effects of sheet resistance (R_{\mathrm{s}}, the ratio of metal resistivity \rho to metal thickness d, R_{\mathrm{s}}=\rho/d) played the dominant role, that the higher R_{\mathrm{s}} usually resulted in the better SH performance. As a result, in the present study the SH properties of metalized polypropylene film with elevated R_{\mathrm{s}} were investigated. The morphology of evaporated area of sample films were observed, and four parameters, the dissipated energy (W_{\{sh}}), the evaporation area (S_{\mathrm{v}}), the peak value of short circuit current (I_{\mathrm{m}}) and the duration time (\tau) were selected to characterize the SH performance. Results showed that electric explosion was more likely to happen during SH process when R_{\mathrm{s}} was higher than 35\ \mathrm{\Omega}, which might threaten the stable operation of capacitors. Besides, W_{\{sh}},\ S_{\mathrm{v}},\ I_{\mathrm{m}} and \tau all decreased with the increase of R_{\mathrm{s}}, benefiting the SH process, but the benefits reduced at high R_{\mathrm{s}} level. Considering the higher dielectric losses and financial costs brought by the elevated R_{\mathrm{s}}, an appropriate R_{\mathrm{s}} of 35\ \mathrm{\Omega} was recommended.
AB - Metalized polypropylene films are widely used as dielectric materials in self-healing (SH) power capacitors due to its higher operation electric field, and the SH properties of metalized film directly decided the performance of capacitors. Among all the film parameters, the effects of sheet resistance (R_{\mathrm{s}}, the ratio of metal resistivity \rho to metal thickness d, R_{\mathrm{s}}=\rho/d) played the dominant role, that the higher R_{\mathrm{s}} usually resulted in the better SH performance. As a result, in the present study the SH properties of metalized polypropylene film with elevated R_{\mathrm{s}} were investigated. The morphology of evaporated area of sample films were observed, and four parameters, the dissipated energy (W_{\{sh}}), the evaporation area (S_{\mathrm{v}}), the peak value of short circuit current (I_{\mathrm{m}}) and the duration time (\tau) were selected to characterize the SH performance. Results showed that electric explosion was more likely to happen during SH process when R_{\mathrm{s}} was higher than 35\ \mathrm{\Omega}, which might threaten the stable operation of capacitors. Besides, W_{\{sh}},\ S_{\mathrm{v}},\ I_{\mathrm{m}} and \tau all decreased with the increase of R_{\mathrm{s}}, benefiting the SH process, but the benefits reduced at high R_{\mathrm{s}} level. Considering the higher dielectric losses and financial costs brought by the elevated R_{\mathrm{s}}, an appropriate R_{\mathrm{s}} of 35\ \mathrm{\Omega} was recommended.
KW - capacitor
KW - metalized film
KW - self-healing
UR - https://www.scopus.com/pages/publications/85099398518
U2 - 10.1109/ICHVE49031.2020.9279759
DO - 10.1109/ICHVE49031.2020.9279759
M3 - 会议稿件
AN - SCOPUS:85099398518
T3 - 7th IEEE International Conference on High Voltage Engineering and Application, ICHVE 2020 - Proceedings
BT - 7th IEEE International Conference on High Voltage Engineering and Application, ICHVE 2020 - Proceedings
PB - Institute of Electrical and Electronics Engineers Inc.
T2 - 7th IEEE International Conference on High Voltage Engineering and Application, ICHVE 2020
Y2 - 6 September 2020 through 10 September 2020
ER -