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Selective Epitaxy of InP on Si and Rectification in Graphene/InP/Si Hybrid Structure

  • Gang Niu
  • , Giovanni Capellini
  • , Fariba Hatami
  • , Antonio Di Bartolomeo
  • , Tore Niermann
  • , Emad Hameed Hussein
  • , Markus Andreas Schubert
  • , Hans Michael Krause
  • , Peter Zaumseil
  • , Oliver Skibitzki
  • , Grzegorz Lupina
  • , William Ted Masselink
  • , Michael Lehmann
  • , Ya Hong Xie
  • , Thomas Schroeder
  • Innovations for High Performance Microelectronics
  • Roma Tre University
  • Humboldt University of Berlin
  • University of Salerno
  • Technical University of Berlin
  • University of California at Los Angeles
  • Brandenburg University of Technology

科研成果: 期刊稿件文章同行评审

30 引用 (Scopus)

摘要

The epitaxial integration of highly heterogeneous material systems with silicon (Si) is a central topic in (opto-)electronics owing to device applications. InP could open new avenues for the realization of novel devices such as high-mobility transistors in next-generation CMOS or efficient lasers in Si photonics circuitry. However, the InP/Si heteroepitaxy is highly challenging due to the lattice (∼8%), thermal expansion mismatch (∼84%), and the different lattice symmetries. Here, we demonstrate the growth of InP nanocrystals showing high structural quality and excellent optoelectronic properties on Si. Our CMOS-compatible innovative approach exploits the selective epitaxy of InP nanocrystals on Si nanometric seeds obtained by the opening of lattice-arranged Si nanotips embedded in a SiO2 matrix. A graphene/InP/Si-tip heterostructure was realized on obtained materials, revealing rectifying behavior and promising photodetection. This work presents a significant advance toward the monolithic integration of graphene/III-V based hybrid devices onto the mainstream Si technology platform.

源语言英语
页(从-至)26948-26955
页数8
期刊ACS Applied Materials and Interfaces
8
40
DOI
出版状态已出版 - 12 10月 2016

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