摘要
Needs for an inexpensive and simple technology for fabricating fine copper (Cu) patterns on a polyimide (PI) film have been increasing. In this study, vacuum-UV induced surfactant masking (VISM) process was proposed as a tool for simplifying selective electroless Cu plating. The electroless Cu plating process using VISM is capable of Cu patterning on solvent-soluble siloxane-modified polyimide (PI) without photoresist patterning steps unlike conventional electroless Cu plating process. The relation between the wettability of SBC-PI film surface and the UV/Ozone treatment time was investigated to establish VISM process condition. The feasibility of the proposed process was verified by demonstrating the fabrication of Cu/PI patterns with widths ranging from 5 μm to 50 μm and measuring an electric property of some patterns.
| 源语言 | 英语 |
|---|---|
| 页(从-至) | 157-161 |
| 页数 | 5 |
| 期刊 | Journal of Photopolymer Science and Technology |
| 卷 | 28 |
| 期 | 2 |
| DOI | |
| 出版状态 | 已出版 - 19 8月 2015 |
| 已对外发布 | 是 |
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