摘要
β-Ga2O3 Schottky barrier diodes (SBDs) have been fabricated on a bulk (100) β-Ga2O3 substrate and tested as X-ray detectors in this study. The devices exhibited good rectification properties, such as a high rectification ratio and a close-to-unity ideality factor. A high photo-to-dark current ratio exceeding 800 was achieved for X-ray detection, which was mainly attributed to the low reverse leakage current in the β-Ga2O3 SBDs. Furthermore, transient response of the β-Ga2O3 X-ray detectors was investigated, and two different detection mechanisms, photovoltaic and photoconductive, were identified. The results imply the great potential of β-Ga2O3 based devices for X-ray detection.
| 源语言 | 英语 |
|---|---|
| 文章编号 | 103502 |
| 期刊 | Applied Physics Letters |
| 卷 | 112 |
| 期 | 10 |
| DOI | |
| 出版状态 | 已出版 - 5 3月 2018 |
| 已对外发布 | 是 |
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