摘要
Bilayered BiFeO3 /ZnO thin films, which were grown on the SrRuO3 -buffered MgO(100) substrate by off-axis radio frequency magnetron sputtering, are investigated for their current-voltage relationships at varying voltages and temperatures. A resistive hysteresis and a diodelike behavior are observed for the bilayered BiFeO3 /ZnO thin films. The resistive hysteresis and the rectification ratio are enhanced with increasing electrical field and temperature. The observed behavior arises from the interfacial depletion layer and ferroelectric switching, where the charge coupling between the semiconducting ZnO and the ferroelectric BiFeO3 layers occurs.
| 源语言 | 英语 |
|---|---|
| 页(从-至) | G9-G12 |
| 期刊 | Electrochemical and Solid-State Letters |
| 卷 | 13 |
| 期 | 2 |
| DOI | |
| 出版状态 | 已出版 - 2010 |
| 已对外发布 | 是 |
学术指纹
探究 'Resistive hysteresis and diodelike behavior of BiFeO3 /ZnO heterostructure' 的科研主题。它们共同构成独一无二的学术指纹。引用此
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