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Research on defect scanning and spatial locating based on CCIT sensor of single-pair electrode

  • Zhao Pan
  • , Yufu Chen
  • , Shan Wang
  • , Yintang Wen
  • , Ruihang Li
  • , Yuyan Zhang
  • Yanshan University

科研成果: 期刊稿件文章同行评审

16 引用 (Scopus)

摘要

Coplanar Capacitance Imaging Technology (CCIT) is a kind of nondestructive testing technology based on a capacitance sensing mechanism. However, the edge information of the image is often blurred, and making an accurate quantitative analysis of defects is impossible. This paper was concerned with scanning detection and locating defects based on the CCIT sensor of single-pair electrode. Firstly, the sensitivity distribution characteristics of the CCIT sensor of single-pair electrode were analyzed, and then the scanning detection and imaging scheme of the CCIT sensor of single-pair electrode were designed. Finally, the spatial location of defects was analyzed by using the capacitance values obtained by scanning detection and the visual images obtained by reconstructing. The feasibility of scanning detection and imaging of the coplanar single-pair electrode capacitance sensor was verified through experiments.

源语言英语
期刊论文编号112060
期刊Measurement: Journal of the International Measurement Confederation
204
DOI
出版状态已出版 - 30 11月 2022
已对外发布

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