跳到主要导航 跳到搜索 跳到主要内容

Relaxor behavior and energy storage performance of ferroelectric PLZT thin films with different Zr/Ti ratios

  • Zhongqiang Hu
  • , Beihai Ma
  • , Shanshan Liu
  • , Manoj Narayanan
  • , Uthamalingam Balachandran
  • Argonne National Laboratory

科研成果: 期刊稿件文章同行评审

86 引用 (Scopus)

摘要

Ferroelectric lead lanthanum zirconate titanate (PLZT) films with 8 mol% lanthanum and different Zr/Ti ratios (70/30, 65/35, 58/42, 52/48, 45/55, and 40/60) have been grown on platinized silicon substrates by chemical solution deposition. The effects of the Zr/Ti ratios on the dielectric and ferroelectric properties were investigated for high-power energy storage applications. These films exhibited relaxor behavior and slim polarization-electric field hysteresis loops, and the degree of phase transition diffuseness decreased with increasing Ti. The PLZT films with Zr/Ti=52/48 had a high spontaneous polarization of ≈51.2 μC/cm2, a low remanent polarization of ≈9.1 μC/cm2, and a low coercive electric field of ≈25.9 kV/cm, leading to a recoverable energy density of ≈30 J/cm3 and a charge-discharge efficiency of ≈78% at room temperature. The high energy density and high efficiency indicate that relaxor PLZT with La/Zr/Ti=8/52/48 is a promising candidate for high-power film capacitors.

源语言英语
页(从-至)557-562
页数6
期刊Ceramics International
40
1 PART A
DOI
出版状态已出版 - 1月 2014
已对外发布

学术指纹

探究 'Relaxor behavior and energy storage performance of ferroelectric PLZT thin films with different Zr/Ti ratios' 的科研主题。它们共同构成独一无二的学术指纹。

引用此