摘要
We report on the realization of short-range-ordered arrays of nanoscale resistive switching blocks in epitaxial Nb-doped SrTiO3 thin films. These blocks can be individually addressed by the tip of a conductive tip atomic force microscope and reversibly switched between a high and a low resistance state reaching an Roff to Ron ratio of up to 50. Scanning micrometer-scale areas with an appropriately biased tip, all blocks within the scanned area can be switched between the two resistive states. We suggest a connection between these nanoscale switching blocks and defect-rich nanoclusters which were detected with high resolution transmission electron microscopy.
| 源语言 | 英语 |
|---|---|
| 文章编号 | 023110 |
| 期刊 | Applied Physics Letters |
| 卷 | 93 |
| 期 | 2 |
| DOI | |
| 出版状态 | 已出版 - 14 7月 2008 |
| 已对外发布 | 是 |
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