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RCTNet-A Defect Detection Network for Tiny Debonding Defects in Terahertz Images

  • Xi'an Jiaotong University

科研成果: 书/报告/会议事项章节 › 会议稿件 › 同行评审

摘要

Due to the limitation of terahertz wavelength and serious development of terahertz devices, terahertz imaging for non-destructive testing has been severely constrained by insufficient data, low spatial resolution, blurred contours and high background noise. In this paper, a THz- TDS system is utilized to conduct experiments on defective samples of composite materials, and time-slice imaging is utilized to obtain defective terahertz image datasets. A THz-RCTNet is proposed to identify the defects with high accuracy, in which CSSPP module and modified loss function effectively increase the detection accuracy of the defects. The model can accurately identify tiny defects and achieve the high-precision localization of defects. In summary, our proposed method is conducive to further development of terahertz image based nondestructive testing technology and fullfil the requirements of realtime defect detection in industrial applications at an early stage.

源语言英语
主期刊名ICSMD 2023 - International Conference on Sensing, Measurement and Data Analytics in the Era of Artificial Intelligence, Proceedings
出版商Institute of Electrical and Electronics Engineers Inc.
ISBN(电子版)9798350318012
DOI
出版状态已出版 - 2023
活动2023 International Conference on Sensing, Measurement and Data Analytics in the Era of Artificial Intelligence, ICSMD 2023 - Xi'an, 中国
期限: 2 11月 2023 → 4 11月 2023

丛书

姓名ICSMD 2023 - International Conference on Sensing, Measurement and Data Analytics in the Era of Artificial Intelligence, Proceedings

会议

会议2023 International Conference on Sensing, Measurement and Data Analytics in the Era of Artificial Intelligence, ICSMD 2023
国家/地区中国
市Xi'an
时期2/11/23 → 4/11/23

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