摘要
Progress in computing speed and algorithm efficiency together with advances in area detector and X-ray optics technologies have transformed the technique of synchrotron radiation-based scanning Laue X-ray microdiffraction. It has now evolved into a near real-time quantitative imaging tool for material structure and deformation at the micrometer and nanometer scales. We will review the achievements of this technique at the Advanced Light Source (Berkeley, CA, USA), and demonstrate its application in the thorough microstructural investigations of laser-assisted 3D printed nickel-based superalloys.
| 源语言 | 英语 |
|---|---|
| 文章编号 | 13 |
| 期刊 | Quantum Beam Science |
| 卷 | 2 |
| 期 | 2 |
| DOI | |
| 出版状态 | 已出版 - 6月 2018 |
学术指纹
探究 'Quantitative scanning laue diffraction microscopy: Application to the study of 3d printed nickel-based superalloys' 的科研主题。它们共同构成独一无二的学术指纹。引用此
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