TY - JOUR
T1 - Prior Knowledge-Augmented Self-Supervised Feature Learning for Few-Shot Intelligent Fault Diagnosis of Machines
AU - Zhang, Tianci
AU - Chen, Jinglong
AU - He, Shuilong
AU - Zhou, Zitong
N1 - Publisher Copyright:
© 1982-2012 IEEE.
PY - 2022/10/1
Y1 - 2022/10/1
N2 - Data-driven intelligent diagnosis models expect to mine the health information of machines from massive monitoring data. However, the size of faulty monitoring data collected in engineering scenarios is limited, which leads to few-shot fault diagnosis as a valuable research point. Fortunately, it is possible to reduce the required amount of training data by integrating prior diagnosis knowledge into diagnosis models. Inspired by this, we present a prior knowledge-augmented self-supervised feature learning framework for few-shot fault diagnosis. In the framework, 24 signal feature indicators are built to form prior features set based on existing diagnosis knowledge. Besides, a convolutional autoencoder is used to mine the general features, which are considered to potentially contain fault information that prior features do not possess. We design a self-supervised learning scheme for training the diagnosis model, which enables the model to learn both prior and general features served as proxy labels. As a result, the model is expected to mine richer features from limited monitoring data. The effectiveness of the proposed framework is verified using two mechanical fault simulation experiments. From the angle of prior diagnosis knowledge, the proposed framework provides a new perspective to the problem of few-shot intelligent diagnosis of machines.
AB - Data-driven intelligent diagnosis models expect to mine the health information of machines from massive monitoring data. However, the size of faulty monitoring data collected in engineering scenarios is limited, which leads to few-shot fault diagnosis as a valuable research point. Fortunately, it is possible to reduce the required amount of training data by integrating prior diagnosis knowledge into diagnosis models. Inspired by this, we present a prior knowledge-augmented self-supervised feature learning framework for few-shot fault diagnosis. In the framework, 24 signal feature indicators are built to form prior features set based on existing diagnosis knowledge. Besides, a convolutional autoencoder is used to mine the general features, which are considered to potentially contain fault information that prior features do not possess. We design a self-supervised learning scheme for training the diagnosis model, which enables the model to learn both prior and general features served as proxy labels. As a result, the model is expected to mine richer features from limited monitoring data. The effectiveness of the proposed framework is verified using two mechanical fault simulation experiments. From the angle of prior diagnosis knowledge, the proposed framework provides a new perspective to the problem of few-shot intelligent diagnosis of machines.
KW - Few-shot learning
KW - Intelligent fault diagnosis
KW - Prior knowledge
KW - Self-supervised learning
UR - https://www.scopus.com/pages/publications/85122885632
U2 - 10.1109/TIE.2022.3140403
DO - 10.1109/TIE.2022.3140403
M3 - 文章
AN - SCOPUS:85122885632
SN - 0278-0046
VL - 69
SP - 10573
EP - 10584
JO - IEEE Transactions on Industrial Electronics
JF - IEEE Transactions on Industrial Electronics
IS - 10
ER -