TY - JOUR
T1 - Preparation, characterization and dielectric response of a high-breakdown-field ZnO-based varistor
AU - Zhao, Xuetong
AU - Li, Shuai
AU - Liao, Ruijin
AU - Zhang, Junyan
AU - Liu, Kanglin
AU - Li, Jianying
N1 - Publisher Copyright:
© 2016, Springer Science+Business Media New York.
PY - 2016/9/1
Y1 - 2016/9/1
N2 - In this study, ZnO-based varistors with a high breakdown field were obtained through BaCO3 doping and sintering at a low temperature of 950 °C. The grain size of the ZnO samples decreased to 1.28 μm, and the breakdown field was enhanced to 3845 V/mm, which is approximately one order of magnitude higher than that of ordinary ZnO-based varistors. The dielectric responses of the ZnO-based varistors were measured in a wide frequency and temperature range. At 193 K, two dielectric relaxation peaks with activation energies of 0.22 and 0.35 eV were observed and considered intrinsic defects; these peaks did not vary with the preparation process. Another dielectric relaxation peak observed in a wide temperature range (283–463 K) was characterized in an impedance plot. This relaxation peak was ascribed to extrinsic defects related to the grain boundary. The resistance values of the grain boundary increased by two orders of magnitude through BaCO3 doping and lowering of the sintering temperature. The corresponding activation energy also increased from 0.53 to 0.74 eV. A parallel resistance–capacitance circuit model was proposed to interpret the variation in the electrical properties of ZnO-based varistors.
AB - In this study, ZnO-based varistors with a high breakdown field were obtained through BaCO3 doping and sintering at a low temperature of 950 °C. The grain size of the ZnO samples decreased to 1.28 μm, and the breakdown field was enhanced to 3845 V/mm, which is approximately one order of magnitude higher than that of ordinary ZnO-based varistors. The dielectric responses of the ZnO-based varistors were measured in a wide frequency and temperature range. At 193 K, two dielectric relaxation peaks with activation energies of 0.22 and 0.35 eV were observed and considered intrinsic defects; these peaks did not vary with the preparation process. Another dielectric relaxation peak observed in a wide temperature range (283–463 K) was characterized in an impedance plot. This relaxation peak was ascribed to extrinsic defects related to the grain boundary. The resistance values of the grain boundary increased by two orders of magnitude through BaCO3 doping and lowering of the sintering temperature. The corresponding activation energy also increased from 0.53 to 0.74 eV. A parallel resistance–capacitance circuit model was proposed to interpret the variation in the electrical properties of ZnO-based varistors.
UR - https://www.scopus.com/pages/publications/84968547420
U2 - 10.1007/s10854-016-4957-8
DO - 10.1007/s10854-016-4957-8
M3 - 文章
AN - SCOPUS:84968547420
SN - 0957-4522
VL - 27
SP - 9196
EP - 9205
JO - Journal of Materials Science: Materials in Electronics
JF - Journal of Materials Science: Materials in Electronics
IS - 9
ER -