跳到主要导航 跳到搜索 跳到主要内容

Patch based vulnerability matching for binary programs

  • Yifei Xu
  • , Zhengzi Xu
  • , Bihuan Chen
  • , Fu Song
  • , Yang Liu
  • , Ting Liu
  • Xi'an Jiaotong University
  • Nanyang Technological University
  • Fudan University
  • ShanghaiTech University

科研成果: 书/报告/会议事项章节会议稿件同行评审

83 引用 (Scopus)

摘要

The binary-level function matching has been widely used to detect whether there are 1-day vulnerabilities in released programs. However, the high false positive is a challenge for current function matching solutions, since the vulnerable function is highly similar to its corresponding patched version. In this paper, the Binary X-Ray (BinXray), a patch based vulnerability matching approach, is proposed to identify the specific 1-day vulnerabilities in target programs accurately and effectively. In the preparing step, a basic block mapping algorithm is designed to extract the signature of a patch, by comparing the given vulnerable and patched programs. The signature is represented as a set of basic block traces. In the detection step, the patching semantics is applied to reduce irrelevant basic block traces to speed up the signature searching. The trace similarity is also designed to identify whether a target program is patched. In experiments, 12 real software projects related to 479 CVEs are collected. BinXray achieves 93.31% accuracy and the analysis time cost is only 296.17ms per function, outperforming the state-of-the-art works.

源语言英语
主期刊名ISSTA 2020 - Proceedings of the 29th ACM SIGSOFT International Symposium on Software Testing and Analysis
编辑Sarfraz Khurshid, Corina S. Pasareanu
出版商Association for Computing Machinery, Inc
376-387
页数12
ISBN(电子版)9781450380089
DOI
出版状态已出版 - 18 7月 2020
活动29th ACM SIGSOFT International Symposium on Software Testing and Analysis, ISSTA 2020 - Virtual, Online, 美国
期限: 18 7月 202022 7月 2020

出版系列

姓名ISSTA 2020 - Proceedings of the 29th ACM SIGSOFT International Symposium on Software Testing and Analysis

会议

会议29th ACM SIGSOFT International Symposium on Software Testing and Analysis, ISSTA 2020
国家/地区美国
Virtual, Online
时期18/07/2022/07/20

学术指纹

探究 'Patch based vulnerability matching for binary programs' 的科研主题。它们共同构成独一无二的指纹。

引用此