摘要
Since the memristor was theoretically predicted at 1971, the research on memristor and memristive behavior has attracted great interest. However, there is a debate about the physical model of the non–zero-crossing (or named non-pinched) current-voltage (I–V) hysteresis behavior observed experimentally in many reported memristive devices. By identifying and analyzing all these non–zero-crossing hysteresis curves, we attribute this behavior to three mechanisms: the involvement of a capacitive effect, the appearance of a ferroelectric or piezoelectric polarization, and the formation of an internal electromotive force. Among them, the memristive behavior involving a capacitive effect has been reported extensively. It demonstrates that the combination of multiple physical properties (memristive and capacitive) in a single device could prefigure potential multifunctional applications. In this review, we discuss the physical mechanism of non–zero-crossing I–V curves, the related research progress with particular emphasis on the origin of non–zero-crossing I–V curves. Moreover, the existing problems in this field and the possible solutions will be discussed, providing an outlook for the future developments.
| 源语言 | 英语 |
|---|---|
| 文章编号 | 100056 |
| 期刊 | Materials Today Advances |
| 卷 | 6 |
| DOI | |
| 出版状态 | 已出版 - 6月 2020 |
| 已对外发布 | 是 |
学术指纹
探究 'Non–zero-crossing current-voltage hysteresis behavior in memristive system' 的科研主题。它们共同构成独一无二的指纹。引用此
- APA
- Author
- BIBTEX
- Harvard
- Standard
- RIS
- Vancouver