TY - JOUR
T1 - Multi-scale attention and dilation network for small defect detection
AU - Xiang, Xinyuan
AU - Liu, Meiqin
AU - Zhang, Senlin
AU - Wei, Ping
AU - Chen, Badong
N1 - Publisher Copyright:
© 2023
PY - 2023/8
Y1 - 2023/8
N2 - Although object detection methods have got surprising performance in simple natural scenes, it is still a challenging task to apply them to complex scenes, especially when the detected objects are small which is common in defect detection tasks of industrial scenarios. Motivated by the higher resolution feature maps, the better detection performance on small objects, we increase the resolution of the feature layers in this paper, and introduce convolutional block attention module (CBAM) into the feature aggregation network to better integrate features at different scales and make better use of the information of small defects. For solving the problem of global context information loss caused by limiting the perceptual field by increasing the resolution of the feature layers, we use dilated convolution blocks to expand the perceptual field. Experimental results show that our method improves the mAP(0.5) on the Industrial Surface Defect Dataset from 88.3% in Yolov5 to 89.2%, mAP(0.75) on the DAGM 2007 increases from 76.56% in Yolov5 to 77.65%, mAP on small object increases by 2.6% on Industrial Surface Defect Dataset and 5.8% on DAGM 2007, which proves the effectiveness of our method for small defect detection.
AB - Although object detection methods have got surprising performance in simple natural scenes, it is still a challenging task to apply them to complex scenes, especially when the detected objects are small which is common in defect detection tasks of industrial scenarios. Motivated by the higher resolution feature maps, the better detection performance on small objects, we increase the resolution of the feature layers in this paper, and introduce convolutional block attention module (CBAM) into the feature aggregation network to better integrate features at different scales and make better use of the information of small defects. For solving the problem of global context information loss caused by limiting the perceptual field by increasing the resolution of the feature layers, we use dilated convolution blocks to expand the perceptual field. Experimental results show that our method improves the mAP(0.5) on the Industrial Surface Defect Dataset from 88.3% in Yolov5 to 89.2%, mAP(0.75) on the DAGM 2007 increases from 76.56% in Yolov5 to 77.65%, mAP on small object increases by 2.6% on Industrial Surface Defect Dataset and 5.8% on DAGM 2007, which proves the effectiveness of our method for small defect detection.
KW - Convolutional block attention module (CBAM)
KW - Dilated convolution blocks
KW - Global context information
KW - Perceptual field
KW - Small object detection
UR - https://www.scopus.com/pages/publications/85161951574
U2 - 10.1016/j.patrec.2023.06.010
DO - 10.1016/j.patrec.2023.06.010
M3 - 文章
AN - SCOPUS:85161951574
SN - 0167-8655
VL - 172
SP - 82
EP - 88
JO - Pattern Recognition Letters
JF - Pattern Recognition Letters
ER -