TY - GEN
T1 - Modelling the Effect of Charge Transport on Surface Flashover in Vacuum
AU - Pan, Shaoming
AU - Chen, George
AU - Wang, Xiaoping
AU - Li, Shengtao
N1 - Publisher Copyright:
© 2019 IEEE.
PY - 2019/10
Y1 - 2019/10
N2 - To explain the phenomenon of surface flashover, the prevailing theory, secondary electron emission avalanche (SEEA), usually applies the assumption of pre-existing positive surface charges. However, for dielectrics on an operating spacecraft, the surfaces are usually negative charged by the space plasma. Thus, the assumption of pre-existing positive surface charges needs to be reconsidered. In our previous experiments, the dielectric surface first suffered electron irradiation, and electrons would deposit on the surface. To illuminate how the surface flashover initiates on a negative charged surface, we established a twodimensional charge transport model, considering impact ionization process in the dielectric surface layer to simulate charge evolution in the pre-flashover stage. The results showed that when the applied voltage was low, homocharge would accumulate in the vicinity of the electrodes, reducing the electric field. When the applied voltage increased to a critical value, impact ionization of the dielectric sub-surface layer began, and positive charge appears in the vicinity of the cathode. The breakdown voltage we obtained from this model was close to our experimental flashover voltage.
AB - To explain the phenomenon of surface flashover, the prevailing theory, secondary electron emission avalanche (SEEA), usually applies the assumption of pre-existing positive surface charges. However, for dielectrics on an operating spacecraft, the surfaces are usually negative charged by the space plasma. Thus, the assumption of pre-existing positive surface charges needs to be reconsidered. In our previous experiments, the dielectric surface first suffered electron irradiation, and electrons would deposit on the surface. To illuminate how the surface flashover initiates on a negative charged surface, we established a twodimensional charge transport model, considering impact ionization process in the dielectric surface layer to simulate charge evolution in the pre-flashover stage. The results showed that when the applied voltage was low, homocharge would accumulate in the vicinity of the electrodes, reducing the electric field. When the applied voltage increased to a critical value, impact ionization of the dielectric sub-surface layer began, and positive charge appears in the vicinity of the cathode. The breakdown voltage we obtained from this model was close to our experimental flashover voltage.
UR - https://www.scopus.com/pages/publications/85081645537
U2 - 10.1109/CEIDP47102.2019.9009905
DO - 10.1109/CEIDP47102.2019.9009905
M3 - 会议稿件
AN - SCOPUS:85081645537
T3 - Annual Report - Conference on Electrical Insulation and Dielectric Phenomena, CEIDP
SP - 588
EP - 591
BT - 2019 IEEE Conference on Electrical Insulation and Dielectric Phenomena, CEIDP 2019 - Proceedings
PB - Institute of Electrical and Electronics Engineers Inc.
T2 - 2019 IEEE Conference on Electrical Insulation and Dielectric Phenomena, CEIDP 2019
Y2 - 20 October 2019 through 23 October 2019
ER -