摘要
In this communication we report some of the features of the heteroepitaxial growth of c-axis-oriented YBa2Cu3O7/SrTiO3 multilayer thin films on (100) SrTiO3 substrates, produced by high pressure oxygen DC- and RF-sputtering. The growth morphology was investigated by high-resolution electron microscopy. Several thickness of the insulating material were tested to investigate the ability of SrTiO3 to homogeneously and epitaxially cover a YBa2Cu3O7 bottom layer. The quality of the individual layers and their interfaces are discussed.
| 源语言 | 英语 |
|---|---|
| 页(从-至) | 1-8 |
| 页数 | 8 |
| 期刊 | Physica C: Superconductivity and its applications |
| 卷 | 191 |
| 期 | 1-2 |
| DOI | |
| 出版状态 | 已出版 - 1 2月 1992 |
| 已对外发布 | 是 |
学术指纹
探究 'Microstructure of heteroepitaxial YBa2Cu3O7/SrTiO3 multilayer thin films' 的科研主题。它们共同构成独一无二的指纹。引用此
- APA
- Author
- BIBTEX
- Harvard
- Standard
- RIS
- Vancouver