Microstructure and electrical conductivity of (Y, Sr)CoO3-δ thin films tuned by the film-growth temperature

Hong Mei Jing; Guang Liang Hu; Shao Bo Mi; Lu Lu; Ming Liu; Shao Dong Cheng; Sheng Cheng; Chun Lin Jia

doi:10.1016/j.jallcom.2017.04.192

Microstructure and electrical conductivity of (Y, Sr)CoO_3-δ thin films tuned by the film-growth temperature

Hong Mei Jing
, Guang Liang Hu
, Shao Bo Mi
, Lu Lu
, Ming Liu
, Shao Dong Cheng
, Sheng Cheng
, Chun Lin Jia

电子与信息学部

Xi'an Jiaotong University
Jülich Research Centre

科研成果: 期刊稿件 › 文章 › 同行评审

6 引用（Scopus）

摘要

Epitaxial films composed of (Y,Sr)CoO_3-δ and nano-scale Y₂O₃ columns are successfully grown on (La_0.289Sr_0.712)(Al_0.633Ta_0.356)O₃(001) substrates at 900 °C. The microstructural and electrical properties of the composite films are investigated and compared with those of the single-phase films prepared at 800 °C. In the composite films oxygen vacancies are detectable, which occur alternately in the stacking CoO_2-δ planes of (Y,Sr)CoO_3-δ. In addition, it is found that a large number of misfit dislocations distribute at the interfaces between the Y₂O₃ columns and the (Y,Sr)CoO_3-δ film matrix. The measured resistivity of the composite films is significantly lower than that of the (Y,Sr)CoO_3-δ single-phase films. Our results indicate that the electrical properties of the perovskite-based cobaltates films can be tuned by changing the microstructure through controlling the film-growth temperature.

源语言	英语
页（从-至）	181-185
页数	5
期刊	Journal of Alloys and Compounds
卷	714
DOI	https://doi.org/10.1016/j.jallcom.2017.04.192
出版状态	已出版 - 2017

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10.1016/j.jallcom.2017.04.192

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@article{f53a05387d544ad9910dbd6242920d1b,

title = "Microstructure and electrical conductivity of (Y, Sr)CoO3-δ thin films tuned by the film-growth temperature",

abstract = "Epitaxial films composed of (Y,Sr)CoO3-δ and nano-scale Y2O3 columns are successfully grown on (La0.289Sr0.712)(Al0.633Ta0.356)O3(001) substrates at 900 °C. The microstructural and electrical properties of the composite films are investigated and compared with those of the single-phase films prepared at 800 °C. In the composite films oxygen vacancies are detectable, which occur alternately in the stacking CoO2-δ planes of (Y,Sr)CoO3-δ. In addition, it is found that a large number of misfit dislocations distribute at the interfaces between the Y2O3 columns and the (Y,Sr)CoO3-δ film matrix. The measured resistivity of the composite films is significantly lower than that of the (Y,Sr)CoO3-δ single-phase films. Our results indicate that the electrical properties of the perovskite-based cobaltates films can be tuned by changing the microstructure through controlling the film-growth temperature.",

keywords = "Electrical properties, Electron microscopy, Interface, Thin films",

author = "Jing, \{Hong Mei\} and Hu, \{Guang Liang\} and Mi, \{Shao Bo\} and Lu Lu and Ming Liu and Cheng, \{Shao Dong\} and Sheng Cheng and Jia, \{Chun Lin\}",

note = "Publisher Copyright: {\textcopyright} 2017 Elsevier B.V.",

year = "2017",

doi = "10.1016/j.jallcom.2017.04.192",

language = "英语",

volume = "714",

pages = "181--185",

journal = "Journal of Alloys and Compounds",

issn = "0925-8388",

publisher = "Elsevier B.V.",

}

TY - JOUR

T1 - Microstructure and electrical conductivity of (Y, Sr)CoO3-δ thin films tuned by the film-growth temperature

AU - Jing, Hong Mei

AU - Hu, Guang Liang

AU - Mi, Shao Bo

AU - Lu, Lu

AU - Liu, Ming

AU - Cheng, Shao Dong

AU - Cheng, Sheng

AU - Jia, Chun Lin

PY - 2017

Y1 - 2017

N2 - Epitaxial films composed of (Y,Sr)CoO3-δ and nano-scale Y2O3 columns are successfully grown on (La0.289Sr0.712)(Al0.633Ta0.356)O3(001) substrates at 900 °C. The microstructural and electrical properties of the composite films are investigated and compared with those of the single-phase films prepared at 800 °C. In the composite films oxygen vacancies are detectable, which occur alternately in the stacking CoO2-δ planes of (Y,Sr)CoO3-δ. In addition, it is found that a large number of misfit dislocations distribute at the interfaces between the Y2O3 columns and the (Y,Sr)CoO3-δ film matrix. The measured resistivity of the composite films is significantly lower than that of the (Y,Sr)CoO3-δ single-phase films. Our results indicate that the electrical properties of the perovskite-based cobaltates films can be tuned by changing the microstructure through controlling the film-growth temperature.

AB - Epitaxial films composed of (Y,Sr)CoO3-δ and nano-scale Y2O3 columns are successfully grown on (La0.289Sr0.712)(Al0.633Ta0.356)O3(001) substrates at 900 °C. The microstructural and electrical properties of the composite films are investigated and compared with those of the single-phase films prepared at 800 °C. In the composite films oxygen vacancies are detectable, which occur alternately in the stacking CoO2-δ planes of (Y,Sr)CoO3-δ. In addition, it is found that a large number of misfit dislocations distribute at the interfaces between the Y2O3 columns and the (Y,Sr)CoO3-δ film matrix. The measured resistivity of the composite films is significantly lower than that of the (Y,Sr)CoO3-δ single-phase films. Our results indicate that the electrical properties of the perovskite-based cobaltates films can be tuned by changing the microstructure through controlling the film-growth temperature.

KW - Electrical properties

KW - Electron microscopy

KW - Interface

KW - Thin films

UR - https://www.scopus.com/pages/publications/85018562462

U2 - 10.1016/j.jallcom.2017.04.192

DO - 10.1016/j.jallcom.2017.04.192

M3 - 文章

AN - SCOPUS:85018562462

SN - 0925-8388

VL - 714

SP - 181

EP - 185

JO - Journal of Alloys and Compounds

JF - Journal of Alloys and Compounds

ER -

Microstructure and electrical conductivity of (Y, Sr)CoO3-δ thin films tuned by the film-growth temperature

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Microstructure and electrical conductivity of (Y, Sr)CoO_3-δ thin films tuned by the film-growth temperature