Measurement and analysis of lattice distortion of CdZnTe single crystal

A method based on X-ray analysis for the measurement of lattice distortion of single crystal was proposed. The asymmetrical Bragg reflection STD scan mode with the conventional X-ray diffraction rocking curve was used to determine the lattice distortion of CdZnTe single crystal in this method. Several rocking curves along different orientations were taken from the same sample during the experimental measurement. By using messages, from different X-ray rocking curves, multiple regression equations for calculating the strains were obtained without determining the diffraction angle in stress-free condition. The lattice distortion in an as-grown CdZnTe single crystal with heavy defects was determined to be 10^-3-10^-2. It is suggested that the distortion is the sum of those introduced by three different reasons, i.e. compositional segregation, crystal defects, such as dislocations, Te precipitates, etc., thermal and mechanical stresses.