摘要
4H Silicon carbide (4H-SiC) is one of the most promising materials for pressure sensing in harsh environments. Due to the low efficiency and high energy consumption of dry etching process, mass manufacturing of SiC pressure sensors has always been a challenging problem. A Yb:KGW femtosecond laser was used to perform the circular diaphragms of bulk 4H-SiC by parallel straight line scanning. Small dimension errors and low surface roughness in rapid etching process were measured. This indicates the potential of utilising the femtosecond laser scanning approach to mass-fabricate bulk SiC sensor chips for pressure sensing.
| 源语言 | 英语 |
|---|---|
| 主期刊名 | Proceedings of the 16th Annual IEEE International Conference on Nano/Micro Engineered and Molecular Systems, NEMS 2021 |
| 出版商 | Institute of Electrical and Electronics Engineers Inc. |
| 页 | 1478-1481 |
| 页数 | 4 |
| ISBN(电子版) | 9781665419413 |
| DOI | |
| 出版状态 | 已出版 - 25 4月 2021 |
| 活动 | 16th Annual IEEE International Conference on Nano/Micro Engineered and Molecular Systems, NEMS 2021 - Xiamen, 中国 期限: 25 4月 2021 → 29 4月 2021 |
出版系列
| 姓名 | Proceedings of the 16th Annual IEEE International Conference on Nano/Micro Engineered and Molecular Systems, NEMS 2021 |
|---|
会议
| 会议 | 16th Annual IEEE International Conference on Nano/Micro Engineered and Molecular Systems, NEMS 2021 |
|---|---|
| 国家/地区 | 中国 |
| 市 | Xiamen |
| 时期 | 25/04/21 → 29/04/21 |
联合国可持续发展目标
此成果有助于实现下列可持续发展目标:
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可持续发展目标 7 经济适用的清洁能源
学术指纹
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