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Location-sensitive sparse representation of deep normal patterns for expression-robust 3D face recognition

  • École centrale de Lyon

科研成果: 书/报告/会议事项章节会议稿件同行评审

16 引用 (Scopus)

摘要

This paper presents a straight-forward yet efficient, and expression-robust 3D face recognition approach by exploring location sensitive sparse representation of deep normal patterns (DNP). In particular, given raw 3D facial surfaces, we first run 3D face pre-processing pipeline, including nose tip detection, face region cropping, and pose normalization. The 3D coordinates of each normalized 3D facial surface are then projected into 2D plane to generate geometry images, from which three images of facial surface normal components are estimated. Each normal image is then fed into a pre-trained deep face net to generate deep representations of facial surface normals, i.e., deep normal patterns. Considering the importance of different facial locations, we propose a location sensitive sparse representation classifier (LS-SRC) for similarity measure among deep normal patterns associated with different 3D faces. Finally, simple score-level fusion of different normal components are used for the final decision. The proposed approach achieves significantly high performance, and reporting rank-one scores of 98.01%, 97.60%, and 96.13% on the FRGC v2.0, Bosphorus, and BU-3DFE databases when only one sample per subject is used in the gallery. These experimental results reveals that the performance of 3D face recognition would be constantly improved with the aid of training deep models from massive 2D face images, which opens the door for future directions of 3D face recognition.

源语言英语
主期刊名IEEE International Joint Conference on Biometrics, IJCB 2017
出版商Institute of Electrical and Electronics Engineers Inc.
234-242
页数9
ISBN(电子版)9781538611241
DOI
出版状态已出版 - 1 7月 2017
活动2017 IEEE International Joint Conference on Biometrics, IJCB 2017 - Denver, 美国
期限: 1 10月 20174 10月 2017

丛书

姓名IEEE International Joint Conference on Biometrics, IJCB 2017
2018-January

会议

会议2017 IEEE International Joint Conference on Biometrics, IJCB 2017
国家/地区美国
Denver
时期1/10/174/10/17

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