TY - GEN
T1 - Local field enhancement effect of the gold-coated nanoprobe
AU - Li, Shaobo
AU - Yang, Shuming
AU - Yang, Xiaokai
N1 - Publisher Copyright:
© 2020 SPIE.
PY - 2020
Y1 - 2020
N2 - The breakthrough of diffraction limit in optical measurement and processing is always an important area. In near-field optics, the resolution is not limited by the diffraction limit, it can achieve ultra-high resolution imaging and surface nanostructure processing, and has important applications in various fields. For the near-field measurement and processing, the local field enhancement effect at the tip is the major factor affecting the spatial resolution. In this paper, the influence factors of the local field enhancement effect of the gold-coated nanoprobe are investigated by using finite difference time domain method, and the effects of incident light source wavelength, incident angle, tip-substrate distance and gold film thickness on the local field enhancement effect are analyzed, so as to provide theoretical guidance for improving the spatial resolution and field enhancement of near-field measurement and processing.
AB - The breakthrough of diffraction limit in optical measurement and processing is always an important area. In near-field optics, the resolution is not limited by the diffraction limit, it can achieve ultra-high resolution imaging and surface nanostructure processing, and has important applications in various fields. For the near-field measurement and processing, the local field enhancement effect at the tip is the major factor affecting the spatial resolution. In this paper, the influence factors of the local field enhancement effect of the gold-coated nanoprobe are investigated by using finite difference time domain method, and the effects of incident light source wavelength, incident angle, tip-substrate distance and gold film thickness on the local field enhancement effect are analyzed, so as to provide theoretical guidance for improving the spatial resolution and field enhancement of near-field measurement and processing.
UR - https://www.scopus.com/pages/publications/85079645370
U2 - 10.1117/12.2523739
DO - 10.1117/12.2523739
M3 - 会议稿件
AN - SCOPUS:85079645370
T3 - Proceedings of SPIE - The International Society for Optical Engineering
BT - Sixth Asia Pacific Conference on Optics Manufacture
A2 - Cheung, Chi Fai Benny
A2 - To, Suet Sandy
PB - SPIE
T2 - 6th Asia Pacific Conference on Optics Manufacture, APCOM 2019
Y2 - 7 January 2019 through 9 January 2019
ER -