摘要
The occurrence of leakage current that can occur in photovoltaic (PV) system depends strongly on the value of parasitic capacitance between PV panel and the ground. However, traditional method to acquire that value is by experience estimation. This paper presents a novel 2-D parasitic edge capacitance model and a straightforward approach to accurately calculate the involved panel parasitic capacitance. The parasitic capacitances are divided into cell-to-frame capacitance Ccf, cell-to-rack capacitance Ccr, and cell-to-ground capacitance Ccg. Based upon that, a pi-shape circuit model is derived to predict the leakage current in the PV array. Theoretical calculation, MATLAB simulations, and experimental measurements finally verify the accuracy of the proposed methods. The approaches are very useful for the evaluation of leakage current in the PV system. It is demonstrated that the proposed approach combines the ease of applications and satisfying accurateness.
| 源语言 | 英语 |
|---|---|
| 文章编号 | 7381668 |
| 页(从-至) | 8205-8217 |
| 页数 | 13 |
| 期刊 | IEEE Transactions on Power Electronics |
| 卷 | 31 |
| 期 | 12 |
| DOI | |
| 出版状态 | 已出版 - 12月 2016 |
联合国可持续发展目标
此成果有助于实现下列可持续发展目标:
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可持续发展目标 7 经济适用的清洁能源
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