Lattice strain and lattice expansion of the SrRuO 3 layers in SrRuO 3/PbZr 0.52Ti 0.48O 3/SrRuO 3 multilayer thin films

C. L. Jia; J. Rodríguez Contreras; U. Poppe; H. Kohlstedt; R. Waser; K. Urban

doi:10.1063/1.1483369

Lattice strain and lattice expansion of the SrRuO ₃ layers in SrRuO ₃/PbZr _0.52Ti _0.48O ₃/SrRuO ₃ multilayer thin films

C. L. Jia
, J. Rodríguez Contreras
, U. Poppe
, H. Kohlstedt
, R. Waser
, K. Urban

Jülich Research Centre

科研成果: 期刊稿件 › 文章 › 同行评审

35 引用（Scopus）

摘要

In SrRuO ₃/PbZr _0.52Ti _0.48O ₃/SrRuO ₃ multilayer thin films on SrTiO ₃ substrates the different lattice distortion behavior of the top and the bottom SrRuO ₃ film layer is found and characterized by means of transmission electron microscopy. The bottom SrRuO ₃ layer is compressively strained in the film plane by a constraint of the SrTiO ₃ substrate. In contrast, in the interface area of the top SrRuO ₃ layer, a lattice dilatation is measured not only in the film plane but also parallel to the film normal. The misfit strain, the lead interdiffusion and the oxygen concentration in this area are investigated and discussed as possible reasons for the unexpected lattice dilatation along the film normal direction.

源语言	英语
页（从-至）	101-105
页数	5
期刊	Journal of Applied Physics
卷	92
期	1
DOI	https://doi.org/10.1063/1.1483369
出版状态	已出版 - 1 7月 2002
已对外发布	是

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@article{a7dd11bdac134df494b868d26d6a7e17,

title = "Lattice strain and lattice expansion of the SrRuO 3 layers in SrRuO 3/PbZr 0.52Ti 0.48O 3/SrRuO 3 multilayer thin films",

abstract = "In SrRuO 3/PbZr 0.52Ti 0.48O 3/SrRuO 3 multilayer thin films on SrTiO 3 substrates the different lattice distortion behavior of the top and the bottom SrRuO 3 film layer is found and characterized by means of transmission electron microscopy. The bottom SrRuO 3 layer is compressively strained in the film plane by a constraint of the SrTiO 3 substrate. In contrast, in the interface area of the top SrRuO 3 layer, a lattice dilatation is measured not only in the film plane but also parallel to the film normal. The misfit strain, the lead interdiffusion and the oxygen concentration in this area are investigated and discussed as possible reasons for the unexpected lattice dilatation along the film normal direction.",

author = "Jia, \{C. L.\} and Contreras, \{J. Rodr{\'i}guez\} and U. Poppe and H. Kohlstedt and R. Waser and K. Urban",

year = "2002",

month = jul,

day = "1",

doi = "10.1063/1.1483369",

language = "英语",

volume = "92",

pages = "101--105",

journal = "Journal of Applied Physics",

issn = "0021-8979",

publisher = "American Institute of Physics",

number = "1",

}

TY - JOUR

T1 - Lattice strain and lattice expansion of the SrRuO 3 layers in SrRuO 3/PbZr 0.52Ti 0.48O 3/SrRuO 3 multilayer thin films

AU - Jia, C. L.

AU - Contreras, J. Rodríguez

AU - Poppe, U.

AU - Kohlstedt, H.

AU - Waser, R.

AU - Urban, K.

PY - 2002/7/1

Y1 - 2002/7/1

N2 - In SrRuO 3/PbZr 0.52Ti 0.48O 3/SrRuO 3 multilayer thin films on SrTiO 3 substrates the different lattice distortion behavior of the top and the bottom SrRuO 3 film layer is found and characterized by means of transmission electron microscopy. The bottom SrRuO 3 layer is compressively strained in the film plane by a constraint of the SrTiO 3 substrate. In contrast, in the interface area of the top SrRuO 3 layer, a lattice dilatation is measured not only in the film plane but also parallel to the film normal. The misfit strain, the lead interdiffusion and the oxygen concentration in this area are investigated and discussed as possible reasons for the unexpected lattice dilatation along the film normal direction.

AB - In SrRuO 3/PbZr 0.52Ti 0.48O 3/SrRuO 3 multilayer thin films on SrTiO 3 substrates the different lattice distortion behavior of the top and the bottom SrRuO 3 film layer is found and characterized by means of transmission electron microscopy. The bottom SrRuO 3 layer is compressively strained in the film plane by a constraint of the SrTiO 3 substrate. In contrast, in the interface area of the top SrRuO 3 layer, a lattice dilatation is measured not only in the film plane but also parallel to the film normal. The misfit strain, the lead interdiffusion and the oxygen concentration in this area are investigated and discussed as possible reasons for the unexpected lattice dilatation along the film normal direction.

UR - https://www.scopus.com/pages/publications/84861425370

U2 - 10.1063/1.1483369

DO - 10.1063/1.1483369

M3 - 文章

AN - SCOPUS:84861425370

SN - 0021-8979

VL - 92

SP - 101

EP - 105

JO - Journal of Applied Physics

JF - Journal of Applied Physics

IS - 1

ER -

Lattice strain and lattice expansion of the SrRuO 3 layers in SrRuO 3/PbZr 0.52Ti 0.48O 3/SrRuO 3 multilayer thin films

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Lattice strain and lattice expansion of the SrRuO ₃ layers in SrRuO ₃/PbZr _0.52Ti _0.48O ₃/SrRuO ₃ multilayer thin films