摘要
Very thin films of Ni, Ta, W, Pb, and Bi in a Ag matrix were irradiated at 77 K with 330 keV Kr ions at doses from 3 to 7×1015 ions/cm2 and analyzed at room temperature by backscattering of 1.9 MeV He+. The measured mixing efficiencies, Dt/φFD, for the various tracers correlate with their respective tracer impurity diffusion coefficients and impurity-vacancy binding energies in Ag. The results concur with previous ones with a Cu matrix and further support the idea that the parameters that are important for thermal diffusion are also important for ion mixing in a thermal spike.
| 源语言 | 英语 |
|---|---|
| 页(从-至) | 2449-2451 |
| 页数 | 3 |
| 期刊 | Journal of Applied Physics |
| 卷 | 63 |
| 期 | 7 |
| DOI | |
| 出版状态 | 已出版 - 1988 |
| 已对外发布 | 是 |
学术指纹
探究 'Ion mixing and thermochemical properties of tracers in Ag' 的科研主题。它们共同构成独一无二的学术指纹。引用此
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