TY - JOUR
T1 - Investigation on the interruption process of molded case circuit breakers including the influence of blow open force
AU - Li, Xingwen
AU - Chen, Degui
AU - Wang, Qian
AU - Dai, Ruicheng
AU - Xiang, Honggang
PY - 2006/8
Y1 - 2006/8
N2 - To one double-breaker model, experimental investigation on blow open force was carried out. It demonstrates that the ratio between the emerging blow open force and arc power FB/ui decreases with the arcing time, the contact gap has less effect on FB/ui, and the characteristics of the blow open force are similar when the peak value of the short circuit current is beyond 4 kA. Then, according to the experimental data and conclusions, considering the influence of blow open force, the interruption process of molded case circuit breakers (MCCBs) was investigated. It demonstrates the blow open force has significant influence on interruption process and the proposed method is effective to evaluate new design of MCCBs.
AB - To one double-breaker model, experimental investigation on blow open force was carried out. It demonstrates that the ratio between the emerging blow open force and arc power FB/ui decreases with the arcing time, the contact gap has less effect on FB/ui, and the characteristics of the blow open force are similar when the peak value of the short circuit current is beyond 4 kA. Then, according to the experimental data and conclusions, considering the influence of blow open force, the interruption process of molded case circuit breakers (MCCBs) was investigated. It demonstrates the blow open force has significant influence on interruption process and the proposed method is effective to evaluate new design of MCCBs.
KW - Blow open force
KW - Circuit breaker
KW - Electro-dynamic repulsion force
KW - Interruption process
UR - https://www.scopus.com/pages/publications/33747874832
U2 - 10.1093/ietele/e89-c.8.1187
DO - 10.1093/ietele/e89-c.8.1187
M3 - 文章
AN - SCOPUS:33747874832
SN - 0916-8524
VL - E89-C
SP - 1187
EP - 1193
JO - IEICE Transactions on Electronics
JF - IEICE Transactions on Electronics
IS - 8
ER -