TY - JOUR
T1 - Investigation of axial and transverse focal spot sizes of Fresnel zone plates
AU - Liu, Tao
AU - Liu, Qiang
AU - Yang, Shuming
AU - Jiang, Zhuangde
AU - Wang, Tong
AU - Zhang, Guofeng
N1 - Publisher Copyright:
© 2017 Optical Society of America.
PY - 2017/5/1
Y1 - 2017/5/1
N2 - An axial spot size formula is given for a standard binary Fresnel zone plate (FZP) illuminated with a linearly polarized beam. The axial spot size, characterized by the full width at half-maximum (FWHM), can be accurately expressed by the Jiang-Wilson formula, viz., dz = 0.97λ0/[η-(η2-NA2)1/2], when the number of transparent annuli is no less than 3. λ0 is the illumination light wavelength, Ç is the refractive index, and NA is the equivalent numerical aperture of a FZP. The transverse spot sizes are near linear with the radial width of the outmost annulus when the corresponding numerical aperture is not very large. This study is carried out based on vectorial angular spectrum theory and has been rigorously confirmed by the three-dimensional finite-difference time-domain method. This finding provides the theoretical basis for applying FZPs in a variety of applications, such as nanolithography, nanoscopy, and high-density data storage.
AB - An axial spot size formula is given for a standard binary Fresnel zone plate (FZP) illuminated with a linearly polarized beam. The axial spot size, characterized by the full width at half-maximum (FWHM), can be accurately expressed by the Jiang-Wilson formula, viz., dz = 0.97λ0/[η-(η2-NA2)1/2], when the number of transparent annuli is no less than 3. λ0 is the illumination light wavelength, Ç is the refractive index, and NA is the equivalent numerical aperture of a FZP. The transverse spot sizes are near linear with the radial width of the outmost annulus when the corresponding numerical aperture is not very large. This study is carried out based on vectorial angular spectrum theory and has been rigorously confirmed by the three-dimensional finite-difference time-domain method. This finding provides the theoretical basis for applying FZPs in a variety of applications, such as nanolithography, nanoscopy, and high-density data storage.
UR - https://www.scopus.com/pages/publications/85018306437
U2 - 10.1364/AO.56.003725
DO - 10.1364/AO.56.003725
M3 - 文章
C2 - 28463260
AN - SCOPUS:85018306437
SN - 1559-128X
VL - 56
SP - 3725
EP - 3729
JO - Applied Optics
JF - Applied Optics
IS - 13
ER -