跳到主要导航 跳到搜索 跳到主要内容

Insights into fundamental deformation processes from advanced in situ transmission electron microscopy

  • Erdmann Spiecker
  • , Sang Ho Oh
  • , Zhi Wei Shan
  • , Yuichi Ikuhara
  • , Scott X. Mao
  • Friedrich-Alexander University Erlangen-Nürnberg
  • Sungkyunkwan University
  • The University of Tokyo
  • University of Pittsburgh

科研成果: 期刊稿件文章同行评审

19 引用 (Scopus)

摘要

In situ nanomechanical testing in (scanning) transmission electron microscopy provides unique opportunities for studying fundamental deformation processes in materials. New insights have been gained by combining advanced imaging techniques with novel preparation methods and controlled loading scenarios. For instance, by applying in situ high-resolution imaging during tensile deformation of metallic nanostructures, the interplay of dislocation slip and surface diffusion has been identified as the key enabler of superplasticity. Evidence for dislocation pinning by hydrogen defect complexes has been provided by in situ imaging under cyclic pillar compression in a tunable gas environment. And, for the very first time, individual dislocations have been moved around in situ in two-dimensional materials by combining micromanipulation and imaging in a scanning electron microscope.

源语言英语
页(从-至)443-449
页数7
期刊MRS Bulletin
44
6
DOI
出版状态已出版 - 1 6月 2019

学术指纹

探究 'Insights into fundamental deformation processes from advanced in situ transmission electron microscopy' 的科研主题。它们共同构成独一无二的指纹。

引用此