跳到主要导航 跳到搜索 跳到主要内容

Influence of sputtering bias on the microstructure and properties of Nb-Si-N films

  • Xi'an Jiaotong University

科研成果: 期刊稿件文章同行评审

25 引用 (Scopus)

摘要

Nb-Si-N films were sputtered by radio frequency powered reactive magnetron sputtering with different bias voltages. The influence of sputtering bias on the microstructure and properties of Nb-Si-N films was studied. The results reveal that as the bias voltage increases the Nb/Si ratio and the surface roughness increase. The microstructure of Nb-Si-N films is the nano-composite structure with nano-sized NbN grains embedded in amorphous SiNx phase. High sputtering bias is in favor of the growth of NbN grains in the Nb-Si-N films. As the bias increases the ε-NbN phase increases. The sheet resistance and microhardness of Nb-Si-N films also change as the bias varies. This phenomenon may be related with the ε-NbN phase in some degree.

源语言英语
页(从-至)4931-4934
页数4
期刊Surface and Coatings Technology
201
9-11 SPEC. ISS.
DOI
出版状态已出版 - 26 2月 2007

学术指纹

探究 'Influence of sputtering bias on the microstructure and properties of Nb-Si-N films' 的科研主题。它们共同构成独一无二的指纹。

引用此