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In-situ synchrotron X-ray study of the elevated temperature deformation response of SS 316L pressurized creep tubes

  • Kun Mo
  • , Hsiao Ming Tung
  • , Xiang Chen
  • , Di Yun
  • , Yinbin Miao
  • , Weiying Chen
  • , Jonathan Aimer
  • , April Novak
  • , James F. Stubbins
  • University of Illinois at Urbana-Champaign
  • Argonne National Laboratory
  • Institute of Nuclear Energy Research Taiwan
  • Oak Ridge National Laboratory

科研成果: 书/报告/会议事项章节会议稿件同行评审

摘要

A high-energy diffraction technique is presented that uses synchrotron X-rays to characterize the in situ deformation response of pressurized creep tubes at elevated temperature. In addition to the X-ray diffraction measurement, the technique allows the macroscopic creep strain to be measured simultaneously during X-ray exposure. We demonstrated this technique in two areas at different temperatures in the tube specimen. From the X-ray diffraction patterns, we obtained a typical creep curve with identifiable secondary and tertiary creep response at the high temperature area, and only observed the secondary creep response at the low temperature area. The diffraction peak broadening analysis directly showed the development of the dislocation structures and lattice strain during deformation and make it possible to track the development of creep void nucleation, growth and coalescence.

源语言英语
主期刊名Small Specimen Test Techniques
主期刊副标题6th Volume
编辑Enrico Lucon, Mikhail A. Sokolov
出版商ASTM International
244-255
页数12
ISBN(电子版)9780803175976
DOI
出版状态已出版 - 2015
已对外发布
活动6th International Symposium on Small Specimen Test Techniques - Houston, 美国
期限: 29 1月 201431 1月 2014

出版系列

姓名ASTM Special Technical Publication
STP 1576
ISSN(印刷版)0066-0558

会议

会议6th International Symposium on Small Specimen Test Techniques
国家/地区美国
Houston
时期29/01/1431/01/14

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