摘要
To achieve higher accuracy in planar near-field measurement, an improved approach based on complex convolutional neural networks is proposed, along with a dataset generation method for model training in this work. This improved method can calculate the spherical wave coefficients from the planar sampling data and then calculate the far-field pattern of the antenna under test. By employing a reasonable model structure and training design, the improved approach attains higher accuracy than conventional method on practical data, offering a new approach to enhance the planar near-field measurement.
| 源语言 | 英语 |
|---|---|
| 期刊 | Proceedings of the IEEE MTT-S International Microwave Workshop Series on Advanced Materials and Processes for RF and THz Applications, IMWS-AMP |
| 期 | 2024 |
| DOI | |
| 出版状态 | 已出版 - 2024 |
| 活动 | 2024 IEEE MTT-S International Microwave Workshop Series on Advanced Materials and Processes for RF and THz Applications, IMWS-AMP 2024 - Nanjing, 中国 期限: 8 11月 2024 → 11 11月 2024 |
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